Crystal Research and Technology · 2005 · 38 citations · 14 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsMaterials CharacterizationMechanical Behavior Of MaterialsMicrostructure AnalysisNanomechanicsPhysical Vapor DepositionSemiconductor Crystal GrowthStrain HardeningWork HardeningCrystal PlasticityStrain Hardening ExponentThermomechanical StressWork Hardening AnalysisWork Hardening Evaluation
Single crystal whiskers of gallium telluride (GaTe) have been grown by the physical vapour deposition (PVD) method. Microindentation studies were carried out on the prism faces of the needles to understand their mechanical behaviour. The variation in the microhardnessof GaTe crystals with applied load has been determined at room temperature using Vickers microhardness indenter. The work- hardening exponent has also been computed for different load regions. (© 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
14