Publication | Closed Access
Characterization of porous silicon layers by grazing- incidence X-ray fluorescence and diffraction
49
Citations
6
References
1991
Year
Materials ScienceSurface CharacterizationEngineeringNanoporous MaterialMicroscopyNanotechnologySurface ScienceApplied PhysicsPorosityPorous Silicon LayersSilicon On InsulatorX-ray Fluorescence
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