XPS, SEM and TEM characterization of stainless-steel 316L surfaces after electrochemical etching and oxidizing

Abstract

Characterization of the structure and chemical composition of nickel oxide films formed on AISI 316L stainless steel by electrochemical anodic treatment in an aqueous electrolyte containing 560 g l−1 NaOH was made by electron microscopy and x-ray photoelectron spectroscopy (XPS). The depth chemical composition, thickness and duplex character of the oxide layers were determined by XPS sputter profiles using 3 keV Ar+ ions. The thickness of these layers was found to depend on the electrochemical conditions (current density or working time of the electrolyte). Ageing and heating changed significantly the structure and chemical composition of the layers. Copyright © 1999 John Wiley & Sons, Ltd.