An XPS and Scanning Polarization Force Microscopy Study of the Exchange and Mobility of Surface Ions on Mica

Abstract

Potassium mica was treated with different ionic solutions to replace the naturally occurring K+ on the surface by Ca2+, Mg2+, and H+ ions. The extent of the exchange was monitored by variable emergence angle X-ray photoelectron spectroscopy (XPS). Scanning polarization force microscopy (SPFM) was used to measure the mobility of the surface ions as a result of water adsorption when the mica is exposed to different humidity levels.