Experimental observation of the characteristic relations of type-I intermittency in the presence of noise

Abstract

Recently, it has been reported that the characteristic relation of type-I intermittency in the presence of noise is deformed nontrivially as the channel width epsilon changes from the positive region to the negative. In order to verify it experimentally as a real phenomenon, we study the characteristic relations both for epsilon<0 and for epsilon>0 in a simple inductor-resistor-diode circuit that is under noisy circumstances. The experimental results agree well with the theoretical expectation that the characteristic relations are <l> proportional to epsilon(-1/4) for epsilon>0 and <l> proportional to exp(alpha/epsilon/(3/2)) for epsilon<0.