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Low lying electronic states of rare gas–oxide anions: Photoelectron spectroscopy of complexes of O− with Ar, Kr, Xe, and N2
15
Citations
36
References
2002
Year
EngineeringPeak BroadeningChemistryElectronic Excited StateDissociation EnergyElectronic StructureChemical EngineeringElectronic StatesInorganic ChemistryPhysicsPhotochemistryOxide ElectronicsChemical BondAtomic PhysicsPhysical ChemistryQuantum ChemistryRare Gas–oxide AnionsExcited State PropertyPhotoelectron SpectroscopyNatural SciencesDissociation EnergiesIon Structure
The negative ion photoelectron spectra of the oxide anion complexes O−Rg, Rg=Ar, Kr, and Xe, and O−N2 have been recorded. In each spectrum, two partially resolved peaks were observed, their relative intensities varying with source conditions. These peaks were assigned to photodetachment transitions from the 2Σ ground state and unresolved 2Π3/2,1/2 low-lying excited states of the anion. From our data we find dissociation energies and bond lengths for the 2Σ and 2Π anion states. Periodic trends in the bond length and dissociation energy are examined and compared to those in the isoelectronic neutral halogen rare gas systems and the effect of anisotropy in the interatomic potential and relative interaction strength is examined. From our data we find that the dissociation energies in the anion system are much larger but that the 2Σ-2Π splitting is significantly lower. In addition to the diatomic clusters, we report the photoelectron spectra of the O−Krn=2–5 and O−Xen=2–3 clusters and tabulate the vertical detachment energies and peak widths. From a comparison of the energetics and peak broadening we are able to make a determination of the general structure of the n=2 and n=3 clusters.
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