ACS Nano · 2009 · 94 citations · 18 references
Natural SciencesMaterials SciencePhysicsMaterials PhysicsNanomaterialsNanotechnologyCarbon NanomaterialsCarbon NanotubesElectron MicroscopyNanotubesRadiation Damage In MaterialsTransmission Electron MicroscopyCarbon Nanotube DefectsElectron Beam Irradiation EffectsHigh-resolution Electron MicroscopyHigh-resolution Transmission Electron MicroscopyIn-situ MonitoringInherent StabilityNanotube DefectsSingle-walled Carbon Nanotubes
We investigate the long-standing question of whether electrons accelerated at 80 kV are below the knock-on damage threshold for single-walled carbon nanotubes (SWNTs). Aberration-corrected high-resolution transmission electron microscopy is used to directly image the atomic structure of the SWNTs and provides in situ monitoring of the structural modification induced by electron beam irradiation at 80 kV. We find that SWNTs with small diameters of 1 nm are damaged by the electron beam, and defects are produced in the side walls that can lead to their destruction. SWNTs with diameters of 1.3 nm and larger are more stable against degradation, and stability increases with diameter. The effect of diameter, defects, and exterior contamination on the inherent stability of SWNTs under electron beam irradiation is investigated.
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Direct evidence for atomic defects in graphene layers
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Chemistry of Single-Walled Carbon Nanotubes
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