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Stoichiometry-related Auger lineshapes in titanium oxides: Influence of valence-band profile and of Coster-Kronig processes
60
Citations
12
References
2004
Year
EngineeringOxidation ResistanceDefect ToleranceLine ShapeValence-band ProfileMaterials EngineeringMaterials SciencePhysicsCrystalline DefectsOxide ElectronicsCoster-kronig ProcessesPhysical ChemistryDefect FormationMicrostructureAuger Line ShapeMaterial AnalysisSurface ScienceApplied PhysicsTitanium Dioxide MaterialsTitanium Oxides
The ability to determine the nature and the occurrence of defects is a central need of ceramic surface chemistry. In titanium oxides, the $\mathrm{Ti}\ensuremath{-}\mathrm{LMV}$ Auger decays line shape is very sensitive to the titanium degree of oxidation, and has long been empirically used as a qualitative probe of the stoichiometry. In the present work, resonant Auger and resonant valence-band measurements at the $\mathrm{Ti}\ensuremath{-}{L}_{2,3}$ edges in ${\mathrm{TiO}}_{2},$ ${\mathrm{TiO}}_{2\ensuremath{-}x}$ and metallic titanium provide a clear evidence that the evolutions of the $\mathrm{Ti}\ensuremath{-}\mathrm{LMV}$ Auger line shape are due to drastic changes in the valence-band profile and in the probability of ${L}_{2}{L}_{3}V$ Coster-Kronig decay processes when a fraction of titanium ions is reduced. Both are shown to be consequences of the filling of $\mathrm{Ti}\ensuremath{-}3d$ states near the Fermi level on defects sites. These conclusions are confirmed by Auger-photoelectron coincidence experiments.
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