Heuristic techniques in computer-aided circuit analysis

TLDR

EL introduces heuristic inspection methods for complex dc bias circuits, contrasting with classical formal techniques, and represents a novel application of AI to circuit analysis. The paper presents EL, a new circuit analysis program. EL’s reasoning is based on local one‑step deduction, teleological principles, and macro‑elements, and the paper provides annotated examples, explains its operation, and shows extensions to sinusoidal steady‑state analysis. EL can explain results qualitatively through its reasoning processes, and the work’s implications for engineering education and CAD technology are briefly discussed.

Abstract

A new kind of circuit analysis program, EL, is presented. Whereas other circuit analysis systems rely on classical, formal, analysis techniques, EL employs heuristic "inspection" methods to solve rather complex dc bias circuits. These techniques also give EL the ability to explain any result in terms of its own qualitative reasoning processes. EL's reasoning is based on the concept of a "local one-step deduction" augmented by various "teleological" principles and by the concept of a "macro-element." Several annotated examples of EL in operation and an explanation of how it works are presented. Also how EL can be extended in several directions, including sinusoidal steady-state analysis is shown. Finally, the possible implications of this work for engineering education and computer-aided design technology are discussed briefly. EL is significant not only as a novel approach to circuit analysis but also as an application of Artificial Intelligence techniques to a new and interesting domain.