Publication | Closed Access
History, present status and future of the contribution of high-voltage electron microscopy to the study of radiation damage and defects in solids
62
Citations
34
References
1991
Year
Materials SciencePresent StatusEngineeringElectron MicroscopyPhysicsMicroscopyApplied PhysicsHigh-voltage Electron MicroscopyElectron DiffractionElectron MicroscopeRadiation Damage
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