Applied Spectroscopy · 1999 · 113 citations · 14 references
Natural SciencesMaterials EngineeringMaterials ScienceSurface ChemistrySurface ScienceThin FilmsFluorescence SpectroscopyPlasmonic MaterialsPlasmonic NanomaterialsPlasmonicsSurface PhysicsThin Film Optical PropertiesAtomic Force Microscopy AnalysisFluorescent MaterialsPlasmonic SurfacesPlasmonic Thin FilmsSteady-state FluorescenceSurface PlasmonsSurface-enhanced Raman ScatteringSurface-enhanced Raman Spectroscopy
Fluorescence is one of the molecular spectroscopic properties that is enhanced by placing the molecule on the rough surface of a coinage metal. The surface-enhanced fluorescence (SEF) can be directly observed in steady-state fluorescence experiments. The observations are the results of a delicate balance between the enhanced emission and the quenching due to energy transfer to nonradiative surface plasmons. In the present report, SiO 2 -coated silver films were fabricated at varying dielectric thickness. The surface of the films was analyzed with the use of atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS). AFM confirms the surface roughness and XPS analysis indicates that the SiO 2 coverage was successful. SEF and SERS (surface-enhanced Raman scattering) were observed on active 6, 10, and 14 nm silver films coated with SiO 2 . Similar results were obtained with a 6 nm silver film coated with 6 nm SiO. The SEF work was carried out on fluorescent molecules with different quantum yield, and the typical enhancement factor obtained for the fluorescent signal was approximately 10. Both the SiO 2 and SiO overlayers provide stable surfaces with well-defined hydrophilic properties. Such stable constructions have applicability towards the advancement of SERS and SEF as routine analytical techniques in bio- and chemical sensors.
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Horia Metiu · Progress in Surface Science · 1984 · 316 citations
Surface‐enhanced Raman scattering of adsorbates
A. Otto · Journal of Raman Spectroscopy · 1991 · 206 citations
Natural Sciences, Chemistry, Physics +17
Wen-Hui Yang, John C. Hulteen, George C. Schatz et al. · The Journal of Chemical Physics · 1996 · 190 citations