Using Optical Ray Tracing to Explain the Reduced Dye Yield of Microdenier Yarns

Abstract

An optical ray trace luster prediction computer model is used to explain the reduced dye yield of microdenier yarns. Results from the model demonstrate that the reduced dye yield is a necessary consequence of the reduced path length of light inside the filaments. Data are shown for the predicted brightness of a set of standard denier per filament and microdenier PET ( Micromattique ) yarns.