X-ray-scattering determination of the dynamic structure factor of Al metal

Abstract

The dynamic structure factor S(q,\ensuremath{\omega}) of conduction electrons in single-crystal Al has been measured using 5.66-keV synchrotron x radiation with 1.5-eV energy resolution. These measurements confirm the existence of strong non-random-phase-approximation-like correlations in an electron liquid where band-structure effects are unimportant.