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The phenomenological model of the microwave surface impedance of high-temperature superconducting films with minimized number of fitting parameters
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1997
Year
Superconducting MaterialEngineeringPhenomenological ModelElectromagnetic CompatibilitySuperconductivityHigh Tc SuperconductorsComputational ElectromagneticsSuperconducting DevicesHts FilmLow-temperature SuperconductivityElectrical EngineeringHigh-tc SuperconductivityPhysicsMicrowave MeasurementMicrowave EngineeringHigh-temperature SuperconductivityApplied PhysicsCondensed Matter PhysicsMinimized NumberLondon Penetration DepthMicrowave Surface ImpedanceElectrical Insulation
A correct phenomenological model of the microwave surface impedance of a high-temperature superconducting (HTS) film with reduced number of fitting parameters is presented. Simple empirical expressions are proposed for London penetration depth at T=0 K and for the residual resistance parameter α versus the fitting parameter γ considered as a figure of merit of the HTS film at microwaves. The model is verified by a comparison of results of modeling and measurement data in a wide temperature range. © 1997 John Wiley & Sons, Inc. Microwave Opt Technol Lett 16: 14–17, 1997.