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Resonance Raman scattering and scanning tunneling spectroscopy of CdS thin films grown by electrochemical atomic layer epitaxy—thickness dependent phonon and electronic properties

Materials ScienceResonance RamanElectronic DevicesEngineeringElectronic MaterialsTunneling MicroscopyApplied PhysicsCds Thin FilmsSemiconductor MaterialElectronic PropertiesThin FilmsMolecular Beam Epitaxy