Publication | Closed Access
Crystallography and Microstructure of Directionally Solidified Oxide Eutectics
81
Citations
22
References
1979
Year
Materials ScienceX-ray CrystallographySolidification RateEngineeringCrystalline DefectsNatural SciencesOxide ElectronicsX-ray DiffractionCondensed Matter PhysicsApplied PhysicsSolid-state ChemistryInverse Square RootIonic Charge CompensationChemistrySolidificationCrystallographyMicrostructure
The crystallographic features of several directionally solidified binary oxide eutectics were examined by the Buerger precession X‐ray method and are discussed in terms of the lattice misfit and ionic charge compensation at the interface, particularly with regard to the oxygen sublattice. Fibrous and lamellar micro‐structures are classified and the resultant morphologies related to the phase volumes. The interphase spacing proportionality to the inverse square root of the solidification rate is examined.
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