Publication | Closed Access
Rapid and simple measurement of critical current density in HTS thin films using a permanent magnet method
38
Citations
9
References
2005
Year
Electrical EngineeringEngineeringCritical Current DensityBias Temperature InstabilityPermanent Magnet MethodHts Thin FilmsApplied PhysicsSuperconductivityThin FilmsThin Film ProcessingMagnetoresistanceSemiconductor Device
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