A non-destructive method for thickness measurement of thin electrospun membranes using white light profilometry

Electrospun nanofibers: solving global issues

Seeram Ramakrishna, K. Fujihara, Wee Eong Teo et al. · Materials Today · 2006 · 1.4K citations · Full text

Natural Sciences, Biotechnology, Materials Science +14

Nanofibrous filtering media: Filtration problems and solutions from tiny materials

R.S. Barhate, Seeram Ramakrishna · Journal of Membrane Science · 2007 · 854 citations

Natural Sciences, Materials Engineering, Materials Science +14

Electrospun nanofibrous filtration membrane

R. Gopal, Sarbjit Kaur, Zhen Ma et al. · Journal of Membrane Science · 2006 · 850 citations

Engineering, Materials Engineering, Materials Science +12

Electrospun nanofibrous polysulfone membranes as pre-filters: Particulate removal

Renuga Gopal, Satinderpal Kaur, Chao Feng et al. · Journal of Membrane Science · 2006 · 342 citations

Engineering, Chemical Engineering, Materials Science +14

Thickness-profile measurement of transparent thin-film layers by white-light scanning interferometry

Seung‐Woo Kim, Gee-Hong Kim · Applied Optics · 1999 · 257 citations

Natural Sciences, Materials Engineering, Materials Science +17