Concepedia

Measurement of an electron-beam size with a beam profile monitor using Fresnel zone plates

Kazuki Iida, Norio Nakamura, Hiroshi Sakai, Kenji Shinoe, H. Takaki, Mariko Fujisawa, H. Hayano, Masaharu Nomura, Y. Kamiya, T. Koseki,

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2003 · 21 citations · 3 references

DOI

Concepts

References

3

Soft X-ray imaging zone plates with large zone numbers for microscopic and spectroscopic applications

B. Niemann, D. Rudolph, G. Schmahl · Optics Communications · 1974 · 153 citations

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Scanning x-ray microscope with 75-nm resolution

H. Rarback, Deming Shu, Su Cheng Feng et al. · Review of Scientific Instruments · 1988 · 108 citations

, , +14

Application of X-ray mask fabrication technologies to high resolution, large diameter Ta Fresnel zone plates

Akira Ozawa, Toshiaki Tamamura, T. Ishii et al. · Microelectronic Engineering · 1997 · 45 citations

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