Publication | Closed Access
Measurement of an electron-beam size with a beam profile monitor using Fresnel zone plates
21
Citations
3
References
2003
Year
Electrical EngineeringEngineeringPhysicsMeasurementCalibrationMicroscopyFresnel Zone PlatesApplied PhysicsEducationElectron DiffractionElectron MicroscopeBeam Transport SystemInstrumentationSynchrotron RadiationElectron-beam SizeElectron OpticBeam Profile MonitorBeam Optic
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