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Laser beam induced current microscopy and photocurrent mapping for junction characterization of infrared photodetectors

PhotonicsElectrical EngineeringPhotoelectric SensorEngineeringPhotodetectorsPhysicsOptical PropertiesInfrared PhotodetectorsInfrared SensorApplied PhysicsPhotoelectric MeasurementLaser BeamOptical SpectroscopyOptoelectronicsJunction CharacterizationCompound Semiconductor