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Integration of single-crystal reflections using area multidetectors
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1988
Year
Single CrystalsX-ray SpectroscopyNuclear PhysicsEngineeringOptic DesignStrongest PeaksX-ray ImagingArea MultidetectorsOptical PropertiesX-ray TechnologyNuclear MaterialsInstrumentationRadiation ImagingReflectanceGraded-reflectivity MirrorsHealth SciencesPhotonicsPhysicsRadiation TransportCrystallographyDepth-graded Multilayer CoatingX-ray DiffractionApplied PhysicsBragg PeaksNeutron ScatteringOptoelectronicsX-ray OpticDiffractive Optic
The development of multidetectors for use in X-ray and neutron scattering experiments has created an interest in methods for integrating Bragg peaks in three-dimensional data arrays representing intensity scattered from single crystals. A method of using a priori information, extracted from the strongest peaks, to obtain statistically optimum results has been developed at the Institut Laue–Langevin (ILL), Grenoble. The method is outlined in this paper and results of its application to neutron diffraction are discussed.