Valency changeover in Sm layers on Si(111)7×7 studied with soft-x-ray-absorption spectroscopy

Abstract

The valency changeover in Sm overlayers on Si(111)7\ifmmode\times\else\texttimes\fi{}7 is probed with high accuracy using x-ray-absorption spectroscopy at the Sm ${\mathit{M}}_{4,5}$ edges. The valency of Sm has been studied as a function of the layer thickness in the chemisorption regime, and compared with the results obtained for epitaxially grown samarium silicide layers.