Magnetic force microscopy study of perpendicular media: Signal-to-noise determination and transition noise analysis

Abstract

Signal-to-noise ratio (SNR) from a limited bit sequence has been extracted from magnetic force microscopy (MFM) images by two different methods and compared. The autocorrelation SNR properties extracted from the MFM image data are in better agreement with spinstand data than “normal” Fourier extracted SNR values. Transition noise data were also extracted and analyzed, “Squeezing” of the noise was measured as the periodicity of the recorded bit pattern became smaller than 250 nm and subsequently a relaxation at ∼200 nm occurred. MFM analysis based SNR data for two media types (CoCrPtTa alloy and CoB/Pd multilayer based) are compared. Ni45Fe55 alloy was used for the soft underlayer material.