Ultramicroscopy · 1990 · 21 citations · 13 references
Natural SciencesMaterials SciencePhysicsInterface ScienceOpticsThin FilmsInterfacial PhenomenaOptical Thin FilmsRefractive IndexThin Film Optical PropertiesFresnel DiffractionFringe AnalysisInterfacial FilmsThin-film Optical Characterization
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<i>Experimental High-Resolution Electron Microscopy</i>
J. C. H. Spence, Albert V. Crewe · Physics Today · 1981 · 716 citations
Grain boundaries in semiconductors
H. J. Leamy, G. E. Pike, C. H. Seager · 1982 · 267 citations