Materials Science in Semiconductor Processing · 2004 · 37 citations · 6 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsCmos Circuit DesignMetal-oxide-semiconductor Field-effect TransistorsSemiconductor Device MaterialsSilicon MaterialsCmos Fabrication ProcessesGate Dielectric EngineeringGate Oxide Thickness EffectsGate OxidesRutile Oxides
6
Etching technique for ruthenium with a high etch rate and high selectivity using ozone gas
M. Nakahara, Shozo Tsunekawa, Kenji Watanabe et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2001 · 41 citations
Natural Sciences, Materials Engineering, Materials Science +13