Publication | Closed Access
Estimating the barrier layer thickness of porous aluminium oxide films with A.C. impedance measurements
11
Citations
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References
1988
Year
Materials ScienceMaterials EngineeringElectrical EngineeringSurface CharacterizationEngineeringOxide ElectronicsSurface ScienceApplied PhysicsA.c. Impedance MeasurementsBarrier Layer ThicknessPorosityThin FilmsPorous AluminiumThin Film ProcessingElectrical Insulation
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