Publication | Closed Access
On the accurate measurement of oxygen self-diffusivities and surface exchange coefficients in oxides via SIMS depth profiling
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Citations
2
References
2001
Year
Surface CharacterizationEngineeringPhysicsSurface Exchange CoefficientsOxide ElectronicsOxidation ResistanceSurface ScienceApplied PhysicsSurface AnalysisTransport PhenomenaPhysical ChemistryOxygen IsotopeSims Depth ProfilingOxygen Self-diffusivitiesChemical Kinetics
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