Publication | Closed Access
Frequency dependence of dielectric properties and electrical conductivity of Cu/nano-SnO2 thick film/Cu arrangement
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Citations
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References
2011
Year
Materials ScienceDielectric PropertiesElectrical EngineeringEngineeringNanomaterialsNanotechnologyNanoelectronicsApplied PhysicsElectrical ConductivitySemiconductor MaterialElectrical PropertyThin Film ProcessingFrequency DependenceElectrical Insulation
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