Publication | Closed Access
An analytical method for determining intrinsic drain/source resistance of lightly doped drain (LDD) devices
16
Citations
3
References
1984
Year
Electrical EngineeringEngineeringApplied PhysicsAnalytical MethodMicroelectronicsIntrinsic Drain/source Resistance
| Year | Citations | |
|---|---|---|
Page 1
Page 1