Journal of Physics Condensed Matter · 1993 · 12 citations · 14 references
Natural SciencesMaterials EngineeringMaterials ScienceOptical MaterialsOpticsThin FilmsOptical Properties Of MaterialsOptical Thin FilmsPlasmonic MaterialsPlasmonicsSurface PhysicsThin Film Optical PropertiesMagnetron SputteringOptical PropertiesPlasmonic Thin FilmsReflectanceSputteringSurface Plasmonic PropertiesSurface PlasmonsTransparency
Optical measurements (photometry and ellipsometry) were performed under oblique incidence from 0.03 eV to 6 eV on silver/silica (Ag/SiO2) multilayers prepared by magnetron sputtering. Around 3.79 eV, the plasma frequency of Ag, and 0.154 eV and 0.133 eV, the longitudinal and transverse optical frequencies of SiO2, resonances are observed, characteristic of the Ferrell and Berreman modes in single Ag and SiO2 layers. These modes and a Brewster mode observed around 3.87 eV are weakly influenced by the SiO2 thickness in the multilayers. Below 3.78 eV, strong coupling effects between surface plasmon modes at the metal/dielectric interfaces generate a transparency window with low reflectance, whose width is well described within the effective medium approximation.
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Predicted Radiation of Plasma Oscillations in Metal Films
Richard A. Ferrell · Physical Review · 1958 · 404 citations