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Publication | Open Access

Characterization of Fault Roughness at Various Scales: Implications of Three-Dimensional High Resolution Topography Measurements

DOIFull Paper Access

210

Citations

46

References

2009

Year

Thibault Candela, François Renard, Michel Bouchon, Alexandre Brouste‌‌‌‌‌‌‌‌‌‌‌‌‌‌‌‌‌‌‌‌‌‌‌‌‌‌‌‌, David Marsan, Jean Schmittbuhl, Christophe Voisin
Pure and Applied Geophysics

References

YearCitations

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