The role of stacking faults and their associated 0.13 ev acceptor state in doped and undoped ZnO layers and nanostructures - Concepedia

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The role of stacking faults and their associated 0.13 ev acceptor state in doped and undoped ZnO layers and nanostructures

39

Citations

25

References

2008

Year

K. Thonke, M. Schirra, R. Schneider, Anton Reiser, G. M. Prinz, Martin Feneberg, Johannes Biskupek, Ute Kaiser, R. Sauer

Microelectronics Journal

References

	Year	Citations

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