Determination of complex dielectric functions at HfO2/Si interface by using STEM-VEELS - Concepedia

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Determination of complex dielectric functions at HfO2/Si interface by using STEM-VEELS

20

Citations

8

References

2008

Year

Jucheol Park, Mino Yang

Electrical EngineeringEngineeringPhysicsHfo2/si InterfaceNanoelectronicsComplex Dielectric FunctionsApplied PhysicsSilicon On InsulatorMicroelectronicsInterface StructureElectrical Insulation

References

	Year	Citations

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