Transmission electron microscopy investigation of the damage produced in individual displacement cascades in GaAs and GaP - Concepedia

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Transmission electron microscopy investigation of the damage produced in individual displacement cascades in GaAs and GaP

43

Citations

8

References

1991

Year

M. W. Bench, I.M. Robertson, Marquis A. Kirk

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

Electron MicroscopyPhysicsMicroscopyApplied PhysicsElectron MicroscopeElectron DiffractionDefect FormationIndividual Displacement CascadesCompound Semiconductor

References

	Year	Citations

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