Appraisal of an Array TEM Method in Detecting a Mined-Out Area Beneath a Conductive Layer - Concepedia

Concepedia

Publication | Closed Access

Appraisal of an Array TEM Method in Detecting a Mined-Out Area Beneath a Conductive Layer

35

Citations

23

References

2015

Year

Hai Li, Guoqiang Xue, Nannan Zhou, Weiying Chen

Pure and Applied Geophysics

Electrical EngineeringEngineeringMined-out Area BeneathSensor ArrayComputer EngineeringConductive LayerComputational ElectromagneticsInstrumentationArray Tem Method

References

	Year	Citations

Page 1