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Residual double acceptors in bulk GaAs
72
Citations
5
References
1983
Year
Ii-vi SemiconductorResidual AcceptorEngineeringPhysicsApplied PhysicsHall MeasurementsSemiconductor MaterialDouble AcceptorLead-free PerovskitesOptoelectronicsCompound SemiconductorResidual Double Acceptors
By using infrared absorption, photoluminescence, and Hall measurements we have observed an additional level associated with a residual acceptor in liquid encapsulated Czochralski GaAs. These results indicate that the defect is a double acceptor with levels 78 and 200 meV above the valence band.
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