SIMS and XPS studies of polyurethane surfaces 2. Polyurethanes with fluorinated chain extenders

Abstract

Abstract A series of fluorine‐containing segmented poly(ether urethanes) and poly(ether urethane ureas), previously characterized by angular dependent x‐ray photoelectron spectroscopy (XPS) have been re‐examined using static secondary ion mass spectrometry (SIMS). Comparison of the data from the two techniques has shown that the intensity of secondary ion signals which characterize the hard and soft segments can be used quantitatively for direct analyis of the molecular composition at the surface. Moreover, the SIMS sampling depth for the conditions used has been shown to be ∼ 10 Å, significantly less than the XPS sampling depth under normal conditions, and similar to the XPS sampling depth at high glancing take‐off angle (with respect to the surface normal).