Concepedia

Determination of layer-thickness fluctuations in Mo/Si multilayers by cross-sectional HR-TEM and X-ray diffraction

A. Aschentrup, Wiebke Hachmann, Th. Westerwalbesloh, Y.C. Lim, U. Kleineberg, U. Heinzmann

Applied Physics A · 2003 · 10 citations · 18 references

DOI

Concepts

References

18

IMD—Software for modeling the optical properties of multilayer films

David L. Windt · Computers in Physics · 1998 · 926 citations · Full text

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Characterization of structures from X-ray scattering data using genetic algorithms

Matthew Wormington, Charles Panaccione, Kevin Matney et al. · Philosophical Transactions of the Royal Society A Mathematical Physical and Engineering Sciences · 1999 · 323 citations

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High-resolution electron microscopy study of x-ray multilayer structures

A. K. Petford‐Long, Mary Beth Stearns, Chung‐ke Chang et al. · Journal of Applied Physics · 1987 · 198 citations

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Sub-arcsecond observations of the solar X-ray corona

L. Golub, Marc Herant, K. Kalata et al. · Nature · 1990 · 163 citations

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Investigation of the amorphous-to-crystalline transition in Mo/Si multilayers

S. Bajt, D. G. Stearns, Patrick A. Kearney · Journal of Applied Physics · 2001 · 147 citations

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