Concepedia

Publication | Closed Access

Structural characterization of DC magnetron-sputtered TiO2 thin films using XRD and Raman scattering studies

DOI

49

Citations

17

References

2003

Year

B. Karunagaran, R.T. Rajendra Kumar, V. Senthil Kumar, D. Mangalaraj, Sa. K. Narayandass, G. Mohan Rao
Materials Science in Semiconductor Processing

References

YearCitations

Page 1