High-resolution electron microscopy and X-ray diffraction studies of MCM-48 - Concepedia

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High-resolution electron microscopy and X-ray diffraction studies of MCM-48

103

Citations

16

References

1995

Year

Ralf Schmidt, Michael Stöcker, Duncan Akporiaye, Elisabeth Heggelund Tørstad, Arne Olsen

Microporous Materials

Electron MicroscopyMicroscopyHigh-resolution Electron MicroscopyChemistryCrystallography

References

	Year	Citations

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