High-resolution electron microscopy investigations of stacking faults in Y<sub>1</sub>Ba<sub>2</sub>Cu<sub>3</sub>O<sub>7−δ</sub> metalorganic chemical vapor deposited thin films - Concepedia

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High-resolution electron microscopy investigations of stacking faults in Y<sub>1</sub>Ba<sub>2</sub>Cu<sub>3</sub>O<sub>7−δ</sub> metalorganic chemical vapor deposited thin films

12

Citations

14

References

1999

Year

C. Grigis, D. Dorignac

Journal of materials research/Pratt's guide to venture capital sources

Materials ScienceEngineeringPhysicsApplied PhysicsCondensed Matter PhysicsDefect FormationThin Film Process TechnologyThin FilmsChemical DepositionChemical Vapor DepositionThin Film Processing

References

	Year	Citations

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