Publication | Closed Access
REM study of high index Si(5 5 12) flat surfaces
30
Citations
18
References
1996
Year
Materials EngineeringMaterials ScienceSurface CharacterizationEngineeringPhysicsSurface AnalysisSurface ScienceApplied PhysicsSemiconductor Device FabricationSilicon On InsulatorRem Study
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