Near-field Lorenz-Mie theory and its application to microholography

Abstract

The full near-field Lorenz-Mie theory is described and applied to Gabor microholography to predict the intensities that are recorded on a microholographic plate. The influence of light polarization and the complex refractive index are discussed. Then, the full near-field Lorenz-Mie theory is compared with the Fraunhofer, the Fresnel, and the far-field Lorenz-Mie theories. Criteria of validity of the simplified theories are deduced.