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Surface extended x-ray absorption fine-structure study of the O(2×1)/Cu(110) system: Missing-row reconstruction and anisotropy in the surface mean free path and in the surface Debye-Waller factor
121
Citations
13
References
1986
Year
Materials SciencePolarization-dependent SurfaceX-ray SpectroscopyEngineeringPhysicsSurface AnalysisSurface ScienceApplied PhysicsX-ray DiffractionSexafs Amplitude ComparisonX-ray FluorescenceSurface Debye-waller FactorX-ray Absorption Fine-structureMissing-row ReconstructionCrystallographySurface Reconstruction
Polarization-dependent surface extended x-ray absorption fine-structure (SEXAFS) measurements on the O(2\ifmmode\times\else\texttimes\fi{}1)/Cu(110) system show that every second [001] Cu row on the surface is missing, thus excluding the buckled-row model for the reconstruction. A SEXAFS amplitude comparison clearly favors the missing-row over the sawtooth model. It also provides evidence for a strong anisotropy of both the surface mean free path and the surface Debye-Waller factor.
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