Advanced materials research · 2014 · 12 citations · 3 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsMaterials CharacterizationMicrowave EngineeringHigh-frequency Semiconductor DevicesMaterial PropertiesMetalsMicrowave MaterialsMicrowave Transmission LinesSemiconductor Device MaterialsBroadband MeasurementConductionConduction LossesCoplanar WaveguidesHigh-frequency ElectronicsHigh-frequency InterconnectsInterconnect CharacterizationMetallization
This paper presents results of the research project: "Characterization of the radio frequency (RF) properties of LDS-MID" where RF parameters of laser direct structureable (LDS) molded interconnect device (MID) materials were investigated. First of all the most important material parameters influencing the RF performance of a device are introduced. In the next section the broadband characterization of the metallization and material properties using a coplanar waveguide (CPW) is described. For a selected LDS material the conduction losses due to different metallization compositions are discussed in detail.
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