GISAXS Characterization of Order in Hexagonal Monolayers of FePt Nanocrystals

Abstract

Hexagonally close-packed monolayers of FePt nanocrystals were deposited on silicon substrates by Langmuir−Blodgett, Langmuir−Schäfer, or spin-coating techniques and characterized by scanning electron microscopy (SEM) and grazing incidence small-angle X-ray scattering (GISAXS). The extent of order in each nanocrystal film is quantified based on the GISAXS data and compared. The LB technique provided the most ordered superlattice films.