Concepedia

Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part II: Experimental Validation for Magnifications from 200 to 10,000

Michael A. Sutton, N. Li, Daniel F. García, Nicolas Cornille, Jean‐José Orteu, S.R. McNeill, Hubert W. Schreier, Xiao Li, A. P. Reynolds

Experimental Mechanics · 2007 · 204 citations · 11 references

DOIFull text

Open access

Concepts

References

11

Camera calibration with distortion models and accuracy evaluation

Juyang Weng, Paul R. Cohen, M. Herniou · IEEE Transactions on Pattern Analysis and Machine Intelligence · 1992 · 1.7K citations

, , +16

Lens distortion for close-range photogrammetry

J. G. Fryer, Dean Brown · Photogrammetric Engineering & Remote Sensing · 1986 · 258 citations

, , +9

Advances in light microscope stereo vision

Hubert W. Schreier, Daniel F. García, Michael A. Sutton · Experimental Mechanics · 2004 · 174 citations

, , +7

Metrology in a scanning electron microscope: theoretical developments and experimental validation

Michael A. Sutton, Ning Li, Dorian Garcia et al. · Measurement Science and Technology · 2006 · 156 citations

, , +17

Development of Patterns for Digital Image Correlation Measurements at Reduced Length Scales

Walter A. Scrivens, Yuan Luo, Michael A. Sutton et al. · Experimental Mechanics · 2006 · 142 citations

, , +9