Interconnect coupling noise in CMOS VLSI circuits

Abstract

Article Free Access Share on Interconnect coupling noise in CMOS VLSI circuits Authors: Kevin T. Tang Department of Electrical and Computer Engineering, University of Rochester, Rochester, New York Department of Electrical and Computer Engineering, University of Rochester, Rochester, New YorkView Profile , Eby G. Friedman Department of Electrical and Computer Engineering, University of Rochester, Rochester, New York Department of Electrical and Computer Engineering, University of Rochester, Rochester, New YorkView Profile Authors Info & Claims ISPD '99: Proceedings of the 1999 international symposium on Physical designApril 1999Pages 48–53https://doi.org/10.1145/299996.300020Published:12 April 1999Publication History 31citation771DownloadsMetricsTotal Citations31Total Downloads771Last 12 Months44Last 6 weeks9 Get Citation AlertsNew Citation Alert added!This alert has been successfully added and will be sent to:You will be notified whenever a record that you have chosen has been cited.To manage your alert preferences, click on the button below.Manage my AlertsNew Citation Alert!Please log in to your account Save to BinderSave to BinderCreate a New BinderNameCancelCreateExport CitationPublisher SiteeReaderPDF