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Characterization of CdTe substrates and MOCVD Cd1−xZnxTe epilayers by Raman, photoluminescence and X-ray diffraction techniques

Materials ScienceIi-vi SemiconductorPhotoluminescenceEngineeringNanomaterialsNanotechnologyCompound SemiconductorApplied PhysicsMocvd Cd1−xznxte EpilayersX-ray Diffraction TechniquesMolecular Beam EpitaxyOptoelectronicsCdte Substrates