Combinatorial approach to the edge delamination test for thin film reliability—concept and simulation - Concepedia

Concepedia

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Combinatorial approach to the edge delamination test for thin film reliability—concept and simulation

15

Citations

15

References

2003

Year

Martin Y.M. Chiang, Wen‐Li Wu, Jianmei He, Eric J. Amis

Thin Solid Films

ReliabilityCombinatorial ApproachEngineeringNondestructive TestingThin Film Reliability—conceptPhysic Of FailureMechanical EngineeringMechanics Of MaterialsEdge Delamination Test

References

	Year	Citations

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